UNIVERSITY PARK, Pa. — Chia-Jung Chang, assistant professor of industrial and manufacturing engineering, has received the Best Applied Paper Prize in Quality and Reliability Engineering by the Institute of Industrial Engineers (IIE) Transactions for her paper.
The paper, "Sequential Measurement Strategy for Wafer Geometric Profile Estimation,: was co-authored with Jianjun Shi, the Carolyn J. Stewart Chair Professor of Industrial and Systems Engineering at Georgia Tech, and Ran Jin, assistant professor of industrial and systems engineering at Virginia Tech.
Motivated by the need of online sensing strategy for water geometric profile estimation, the authors proposed an engineering driven sequential sensing strategy to achieve satisfied sensing accuracy and also significantly reduced both sample size and measurement time. This research has made impacts on high-definition profile sensing, modeling and control which has broad applications on different kinds of engineered surfaces including wafer profiles, hip implants and dental implants.
Chang and her colleagues will be recognized at the IIE Annual Conference and Expo in San Juan, Puerto Rico, in May.