UNIVERSITY PARK, Pa. — A quasi-particle that travels along the interface of a metal and dielectric material may be the solution to problems caused by shrinking electronic components, according to an international team of engineers.
"Microelectronic chips are ubiquitous today," said Akhlesh Lakhtakia, Evan Pugh University Professor and Charles Godfrey Binder Professor of Engineering Science and Mechanics, Penn State. "Delay time for signal propagation in metal-wire interconnects, electrical loss in metals leading to temperature rise, and cross-talk between neighboring interconnects arising from miniaturization and densification limits the speed of these chips."
These electronic components are in our smartphones, tablets, computers and security systems and they are used in hospital equipment, defense installations and our transportation infrastructure.
Researchers have explored a variety of ways to solve the problem of connecting various miniaturized components in a world of ever shrinking circuits. While photonics, the use of light to transport information, is attractive because of its speed, this approach is problematic because the waveguides for light are bigger than current microelectronic circuits, which makes connections difficult.
Surface plasmon-polariton (SPP) waves have been known for a long time, but the mathematics behind them requires solving complex equations. Lakhtakia and colleagues investigated the theoretical transport of information by using an SPP wave as a carrier wave and pulsing the wave in a way similar to the way Morse code electrically pulses through a telegraph line.